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dc.contributor.authorIraklii I. Ebralidze-
dc.contributor.authorMohammad Hanif-
dc.contributor.authorRubaiyat Arjumand-
dc.contributor.authorAlyza A. Azmi-
dc.contributor.authorDaniel Dixon-
dc.contributor.authorNatalie M. Cann-
dc.contributor.authorCathleen M. Crudden-
dc.contributor.authorJ. Hugh Horton-
dc.date.accessioned2017-04-16T08:32:46Z-
dc.date.available2017-04-16T08:32:46Z-
dc.date.issued2012-01-
dc.identifier.urihttp://hdl.handle.net/123456789/5853-
dc.description.abstractThis article reports adhesion interactions between siliconsupported dichlorotriazine films in various solvents. The formation, chemical composition, and thickness of the overlayer were analyzed by means of X-ray photoelectron spectroscopy (XPS). An atomic force microscopy (AFM) characterization was performed to evaluate the overlayer roughness. Adhesion interactions were measured using chemical force spectrometry (CFS). The purpose of the study is to understand the effect of solvents on the adhesion force between dichlorotriazine films.en_US
dc.language.isoenen_US
dc.publisherJournal of Physical Chemistry Cen_US
dc.titleSolvent Induced Adhesion Interactions between Dichlorotriazine Filmsen_US
dc.typeArticleen_US
Appears in Collections:Journal Articles

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